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* * * *
TE CH
Preliminary T4312816A
SDRAM
FEATURES
3.3V power supply Four banks operation LVTTL compatible with multiplexed address All inputs are sampled at the positive going edge of system clock * Burst Read Single-bit Write operation * DQM for masking * Auto refresh and self refresh * 64ms refresh period (4K cycle) * MRS cycle with address key programs - CAS Latency ( 2 & 3 ) - Burst Length ( 1 , 2 , 4 , 8 & full page) - Burst Type (Sequential & Interleave) * Available package type in 54 pin TSOP(II) * Operating temperature : 0 ~ +70 C
8M x 16 SDRAM
2M x 16bit x 4Banks Synchronous DRAM
GRNERAL DESCRIPTION
The T4312816A is 134,217,728 bits synchronous high data rate Dynamic RAM organized as 4 x 2,097,152 words by 16 bits, fabricated technology . Synchronous design allows precise cycle control with the use of system clock I/O transactions are possible on every clockcycle . Range of operating frequencies , programmable burst length and programmable latencies allow the same device to be useful for a variety of high bandwidth , high performance memory system applications. with high performance CMOS
ORDERING INFORMATION
PART NO. MAX FREQUENCY TEMPERATURE
PIN ARRANGEMENT (Top View)
V
DD
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 5 4 P IN T S O P ( II) (4 0 0 m il x 8 7 5 m il) (0 .8 m m P IN P IT C H )
54 53 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28
V ss D Q 15 V
SSQ
DQ0
T4312816A-6S T4312816A-7S T4312816A-7.5S T4312816A-8S T4312816A-10S
166 MHz 143 MHz 133 MHz 125 MHz 100 MHz
0 ~ +70C 0 ~ +70C 0 ~ +70C 0 ~ +70C 0 ~ +70C
V
DDQ
DQ1 DQ2 V
SSQ
D Q 14 D Q 13 V
DDQ
DQ3 DQ4 V
DDQ
D Q 12 D Q 11 V SSQ DQ1 0 DQ9 V
DDQ
DQ5 DQ6 V
SSQ
DQ7 V
DD
DQ8 V ss N .C /R F U UDQM CLK CKE N .C A 11 A9 A8 A7 A6 A5 A4 V ss
LD Q M WE CAS RAS CS BA0 BA1 A 1 0 /A P A0 A1 A2 A3 V
DD
TM Technology Inc. reserves the right P. 1 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
TE CH
Preliminary T4312816A
BLOCK DIAGRAM
I/O Control
Bank Select
D ata Input R egister
2M x 16 2M x 16 2M x 16 2M x 16
Row Decoder
Row Buffeer Refresh Counter
Sense AM P
Output Buffer
D Qi
Address Register
C LK
A DD
LCBR
LRAS
Tim ing Register
Col. Buffer
C olum n D ecoder
Latency & Burst Length
Program m ing R egister
C LK
C KE
CS
R AS
C AS
WE
L(U)D QM
TM Technology Inc. reserves the right P. 2 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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PIN CLK
TE CH
Preliminary T4312816A
PIN DESCRIPTION
NAME System Clock Chip Select INPUT FUNCTION
Active on the positive going edge to sample all input. Disables or enables device operation by masking or enabling all input except CLK,CKE and L(U)DQM Masks system clock to freeze operation from the next clock cycle.
CS
CKE
Clock Enable
CKE should be enabled at least one cycle prior to new command. Disable input buffers for power down in standby.
A0 ~ A11 BA0 ~ BA1
Address Bank Select Address
Row/column addresses are multiplexed on the same pins. Row address : RA0 ~ RA11,column address : CA0 ~ CA8 Selects bank to be activated during row address latch time. Select bank for read/write during column address latch time. Latches row addresses on the positive going edge of the CLK
RAS
Row Address Strobe with RAS low.
Enables row access & precharge. Latches column addresses on the positive going edge of the CLK
CAS
Column Address Strobe with CAS low.
Enables column access .
WE L(U)DQM DQ0 ~ DQ15 VDD/VSS VDDQ/VSSQ
Write Enable Data Input/Output Mask Data Input/Output
Enables write operation and row precharge. Latches data in starting from CAS , WE active. Makes data output Hi-Z, tSHZ after the clock and masks the output. Blocks data input when L(U)DQM active. Data inputs/outputs are multiplexed on the same pins.
Power Supply/Ground Power and ground for the input buffers and the core logic. Data Output Power/Ground No Connection/Reserved for Future Use
Isolated power supply and ground for the output buffers to provide improved noise immunity. This pin is recommended to be left No Connection on the device.
N.C/RFU
TM Technology Inc. reserves the right P. 3 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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Parameter
TE CH
Preliminary T4312816A
ABSOLUTE MAXIMUM RATINGS
Symbol VIN,VOUT VDD,VDDQ Iout PD TOPR Tstg Value -1.0 to 4.6 -1.0 to 4.6 50 1 0 to +70 -55 to +150 Unit V V mA W C C Voltage on Any Pin Relative To Vss Supply Voltage Relative To Vss Short circuit Output Current Power Dissipation Operating Temperature Storage Temperature
Note : Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to recommended operating condition. Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
RECOMMENDED DC OPERATING CONDITIONS
(TA = 0 to +70C, Voltage referenced to VSS=0V)
Parameter Supply Voltage Input High Voltage Input Low Voltage Output logic high voltage Output logic low voltage Input leakage current Output leakage current Symbol VDD,VDDQ VIH VIL VOH VOL IIL IOL Min. 3.0 2.0 -0.3 2.4 -1 -1.5 Typ 3.3 3.0 0 Max. 3.6 VDD+0.3V 0.8 0.4 1 1.5 Unit V V V V V uA uA IOH=-4mA IOL=4mA 1 2 Notes
Note : 1. Any input 0V VIN VDD+ 0.3V , all other pin are not under test = 0V. 2. Dout = disable, 0V VOUT VDD .
CAPACITANCE
(TA =25C,VDD=3.3V, f = 1MHz)
Pin CLOCK ADDRESS DQ0 ~ DQ15 RAS,CAS,WE,CS,CKE,LDQM, UDQM Symbol CCLK CADD COUT CIN Min 2.5 2.5 4.0 2.5 Max 4.0 5.0 6.5 5.0 Unit pF pF pF pF
TM Technology Inc. reserves the right P. 4 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
TE CH
Preliminary T4312816A
DC CHARACTERISTICS
TA = 0 to 70C , VIH(min)/VIL(max)=2.0V/0.8V
Parameter Operating Current ( One Bank Active) Symbol -6 ICC1 Speed version -7 -7.5 -8 -10
Burst Length = 1
Unit
Test Condition
Note
140 120 115 110 100 mA 2 2 20 mA 8 5 4 30 mA 20 150 130 125 120 110 150 130 125 120 110
tRCtRC(min) ,tCCtCC(min),IOL= 0 mA
CKE VIL(max),tCC=15ns
1,3
Precharge Standby ICC2P Current in powerICC2PS down mode Precharge Standby Current in non power-down mode ICC2N ICC2NS Active Standby ICC3P Current in powerICC3PS down mode Active Standby ICC3N Current in non power-down mode (One Bank Active) ICC3NS Operating Current (Burst Mode) Refresh Current Self refresh Current ICC4
mA
CKE VIL(max),CLK
VIL(max), tCC =
3
CKE VIH(min), CS VIH(min),tCC=15ns Input signals are changed one time during 30ns CKEVIH(min),CLK VIL(min),tCC= Input signals are stable CKE VIL(max),tCC=15ns CKE VIL(max),CLK
3
mA
VIL(max),tCC=
3
CKEVIH(min), CS VIH(min),tCC=15ns Input signals are changed one time during 30ns CKEVIH(min),CLK VIL(min),tCC= Input signals are stable CAS Latency 3 IOL=0 mA,Page Burst All Band Activated CAS Latency 2
3
mA
1,3
tCCD= tCCD(min) 2,3
ICC5 ICC6
150 130 125 120 110 mA tRC tRC(min) 2 mA
CKE 0.2V
Note:
1. Measured with output open. Addresses are changed only one time during tCC(min) . 2. Refresh period is 64ms. Addresses are changed only one time during tCC(min) . 3. tCC : Clock cycle time. tRC : Row cycle time. tCCD : Column address to column address delay time.
TM Technology Inc. reserves the right P. 5 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
TE CH
Preliminary T4312816A
AC OPERATING CONDITIONS
(VDD=3.3V 0.3V ,TA= 0 to 70C) Parameter
Input levels (VIH/VIL) Input timing measurement reference level Input rise and fall time Output timing measurement reference level Output load condition
Value
2.4 / 0.4 1.4
Unit
V V ns V
tr / tf = 1 / 1
1.4 See Fig.2
3.3V 1200 ohm Output 870 ohm VOH(DC )=2.4,IOH=-4m A VOL(DC )=0.4,IOL=4mA ZO=50 ohm
Vtt=1.4v 50 ohm
Output
30pf
30pf
(Fig.1) DC Output Load Circuit
(Fig.2)AC Output Load Circuit
TM Technology Inc. reserves the right P. 6 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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TE CH
Preliminary T4312816A
OPERATING AC PARAMETER
(AC opterating conditions unless otherwise noted) Parameter
Row active to row active delay RAS to CAS delay Row precharge time Row active time Row cycle time Last data in to new col. Address delay Last data in to row precharge Last data in to burst stop Col. Address to col. Address delay Number of valid output data
Symbol
-6
12 15 15 42 60
Speed Version -7 -7.5 -8
14 15 15 42 63 15 18 20 45 120K 65 1 2 1 1 1 1 68 16 20 20 48
-10
20 20 20 50 70
Unit
ns ns ns ns ns ns CLK CLK CLK CLK ea
Note
1 1 1 1 1 2 2 2 3 4
tRRD(min) tRCD(min) tRP(min) tRAS(min) tRAS(max) tRC(min) tCDL(min) tRDL(min) tBDL(min) tCCD(min)
CAS latency=3 CAS latency=2
Note: 1. The minimum number of clock cycles is determined by dividing the minimum time required
with clock cycle time and then rounding off to the next higher integer. 2. Minimum delay is required to complete write. 3. All parts allow every cycle column address change. 4. In case of row precharge interrupt, auto precharge and read burst stop. The earliest a precharge command can be issued after a Read command without the loss of data is CL + BL-2 clocks.
TM Technology Inc. reserves the right P. 7 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
TE CH
Preliminary T4312816A
AC CHARACTERISTICS
(AC opterating conditions unless otherwise noted) Parameter
CAS Latency = 3 CLK cycle time CAS Latency = 2 CLK to valid Output delay CAS Latency = 3 CAS Latency = 2 Symbol 6
-6
Min Max
-7
Min Max
-7.5
Min Max
-8
Min Max
-10
Min Max
Unit Note
ns 1
1K
7 9
1K 7.5 1K 9 6 6 2.5 2.5 2.5 1.75 1 1 6 6 6 6 6 6
8 10 2.5 3 3 2 1 1 -
1K
10 10
1K
tCC tSAC tOH tCH tCL tSS tSH tSLZ tSHZ
8 2 2 2 1.5 1 1 5.5 6 5.5 6
2.5 2.5 2.5 1.75 1 1 -
6 7
2.5 3 3 2.5 1 1
7 9
ns 1 ns ns ns ns ns ns ns 2 3 3 3 3 2
Output data hold time CLK high pulse width CLK low pulse width Input setup time Input hold time CLK to output in Low-Z CLK to output in CAS Latency = 3 Hi-Z CAS Latency = 2
6 7
-
7 9
ns ns
Note: 1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns,(tr/2-0.5)ns should be added to the parameter. 3. Assumed input rise and fall time (tr & tf)=1ns.
If tr & tf is longer than 1ns,transient time compensation should be considered, i.e.,[(tr+tf)/2-1]ns should be added to the parameter.
TM Technology Inc. reserves the right P.8 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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TE CH
Preliminary T4312816A
(Unit : number of clock)
CAS Latency
3 3 2 2 2
FREQUENCY vs. AC PARAMETER RELATIONAHIP TABLE
T4312816A-6S
Frequency
166MHz(6.0ns) 143MHz(7.0ns) 125MHz(8.0ns) 111MHz(9.0ns) 100MHz(10.0ns)
tRC
60ns
10 9 9 7 7
tRAS
42ns
7 6 6 5 5
tRP
15ns
3 3 2 2 2
tRRD
12ns
2 2 2 2 2
tRCD
15ns
3 3 2 2 2
tCCD
6ns
1 1 1 1 1
tCDL
6ns
1 1 1 1 1
tRDL
12ns
2 2 2 2 2
T4312816A-7S
Frequency
143MHz(7.0ns) 125MHz(8.0ns) 111MHz(9.0ns) 100MHz(10.0ns) 83MHz(12.0ns)
(Unit : number of clock)
CAS Latency
3 3 2 2 2
tRC
63ns
9 9 8 7 6
tRAS
42ns
6 6 5 5 4
tRP
15ns
3 2 2 2 2
tRRD
14ns
2 2 2 2 2
tRCD
15ns
3 2 2 2 2
tCCD
7ns
1 1 1 1 1
tCDL
7ns
1 1 1 1 1
tRDL
14ns
2 2 2 2 2
T4312816A-7.5S
Frequency
133MHz(7.5ns) 125MHz(8.0ns) 111MHz(9.0ns) 100MHz(10.0ns) 83MHz(12.0ns)
(Unit : number of clock)
CAS Latency
3 3 2 2 2
tRC
65ns
9 9 8 7 6
tRAS
45ns
6 6 5 5 4
tRP
20ns
3 3 3 2 2
tRRD
15ns
2 2 2 2 2
tRCD
18ns
3 3 2 2 2
tCCD
7.5ns
1 1 1 1 1
tCDL
7.5ns
1 1 1 1 1
tRDL
15ns
2 2 2 2 2
T4312816A-8S
Frequency
125MHz(8.0ns) 111MHz(9.0ns) 100MHz(10.0ns) 83MHz(12.0ns) 75MHz(13.0ns)
(Unit : number of clock)
CAS Latency
3 3 2 2 2
tRC
68ns
9 9 7 6 6
tRAS
48ns
6 6 5 4 4
tRP
20ns
3 3 2 2 2
tRRD
16ns
2 2 2 2 2
tRCD
20ns
3 3 2 2 2
tCCD
8ns
1 1 1 1 1
tCDL
8ns
1 1 1 1 1
tRDL
16ns
2 2 2 2 2
T4312816A-10S
Frequency
100MHz(10.0ns) 83MHz(12.0ns) 75MHz(13.0ns) 66MHz(15.0ns) 60MHz(16.7ns)
(Unit : number of clock)
CAS Latency
2 2 2 2 2
tRC
70ns
7 7 6 6 5
tRAS
50ns
5 5 4 4 3
tRP
20ns
2 2 2 2 2
tRRD
20ns
2 2 2 2 2
tRCD
20ns
2 2 2 2 2
tCCD
10ns
1 1 1 1 1
tCDL
10ns
1 1 1 1 1
tRDL
20ns
2 2 2 2 Note 1
Note : 1. tRDL 16.7ns is recommended for T4312816A base value 2. Clock count formula : clock (round off whole number). clock period
TM Technology Inc. reserves the right P.9 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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11 0 11 x 11 10 0 10 x 10 9 0 9 1 9
TE CH
8 0 8 0 8 1 8 1 8 0 7 1 7 0 7 0 7 1 7 0 6 5 4 3 2 1 0
Preliminary T4312816A
MODE REGISTER
JEDEC Standard Test Set (refresh counter test) 6 5 4 LTMODE 6 5 4 3 WT 3 2 1 BL 1 0
Burst Read and Single Write (for Write Through Cache)
0
2
Use in future
6 v 5 v 4 v 3 v 3 WT 2 v 2 1 v 1 BL 0 v 0
11 x 11 0
10 x 10 0
9 x 9 0
Vender Specific v = Valid x = Don't care
Bit2-0 000 001 010 011 100 101 110 111 0 WT=0 1 2 4 8 R R R Full page Sequential Interleave CAS Latency R R 2 3 R R R R Remark R : Reserved WT=1 1 2 4 8 R R R R
6 5 4 LTMODE
Mode Register Set
Burst length
Wrap type
1 Bit6-4 000 001 010 011 100 101 110 111
Latency mode
Mode Register Write Timing
CLOCK CKE CS RAS CAS WE
A0-A11
TM Technology Inc. reserves the right P.10 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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TE CH
Preliminary T4312816A
Burst Length and Sequence
(Burst of Two)
Starting Address (column address A0 binary) Sequential Addressing Sequence (decimal) Interleave Addressing Sequence (Decimal)
0 1 (Burst of Four)
Starting Address (column address A1-A0 binary)
0,1 1,0
0,1 1,0
Sequential Addressing Sequence (decimal)
Interleave Addressing Sequence (Decimal)
00 01 10 11 (Burst of Eight)
Starting Address (column address A2-A0 binary)
0,1,2,3 1,2,3,0 2,3,0,1 3,0,1,2
0,1,2,3 1,0,3,2 2,3,0,1 3,2,1,0
Sequential Addressing Sequence (decimal)
Interleave Addressing Sequence (Decimal)
000 001 010 011 100 101 110 111
8Mx16 divice.
0,1,2,3,4,5,6,7 1,2,3,4,5,6,7,0 2,3,4,5,6,7,0,1 3,4,5,6,7,0,1,2 4,5,6,7,0,1,2,3 5,6,7,0,1,2,3,4 6,7,0,1,2,3,4,5 7,0,1,2,3,4,5,6
0,1,2,3,4,5,6,7 1,0,3,2,5,4,7,6 2,3,0,1,6,7,4,5 3,2,1,0,7,6,5,4 4,5,6,7,0,1,2,3 5,4,7,6,1,0,3,2 6,7,4,5,2,3,0,1 7,6,5,4,3,2,1,0
Full page burst is an extension of the above tables of Sequential Addressing, with the length being 512 for
POWER UP SEQUENCE
1. Apply power and start clock, attempt to maintain CKE = `H' , L(U)DQM = `H' and the other pin are NOP condition at the inputs. 2. Maintain stable power, stable clock and NOP input condition for a minimum of 200us. 3. Issue precharge commands for all banks of the devices. 4. Issue 2 or more auto-refresh commands. 5. Issue mode register set command to initalize the mode register. Cf.) Sequence of 4 & 5 is regardless of the order.
TM Technology Inc. reserves the right P.11 to change products or specifications without notice.
Publication Date:APR. 2003 Revision: 0.B
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Register Refresh
TE CH
Preliminary T4312816A
SIMPLIFIED TRUTH TABLE
COMMAND BA A10/AP A9~A0, Note CKEn-1 CKEn CS RAS CAS WE DQM A11 0,1 Mode Register Set H X L L L L X X 1,2 Auto Refresh Self Refresh Entry Exit H L H H H H H H L H L H H H X H L H X X X X X L H L H L L H L L L L L H L X H L H L L H X L H H H L X V X X H X V X L H X H L L H H X V X X H X V H H X H H L L L X V X X H X V X X X X X X X X X X X X V X 7 V X L H X V V V X X Row Address L H L H X
Column Address (A0~A8) Column Address (A0~A8)
3 3
Bank Active & Row Address
Auto Precharge Disable Read Column Auto Precharge Enable Address Write & Column Auto Precharge Disable Auto Precharge Enable Address Burst Stop
4,5 4,5 6 4
Precharge
Bank Selection Both Banks Entry Exit Entry
Clock Suspend or Active Power Down Precharge Power Down Mode DQM No Operation Command
Exit
H X X X X X L H H H (V=Valid , X=Don't Care , H=Logic High , L=logic Low)
Notes : 1. OP Code : Operation Code. A0~A11 , BA0~BA1 : Program keys.(@MRS) 2. MRS can be issued only at both banks precharge state. A new command can be issued after 2 clock cycle of MRS. 3. Auto refresh functions are as same as CBR refresh of DRAM. The automatical precharge without row precharge command is meant by `Auto'. Auto / self refresh can be issued only at both banks precharge state. 4. BA0~BA1 : Bank select address. If both BA0 and BA1 are 'Low' : at read , write , row active and precharge , bank A is selected. If both BA0 is `Low' and BA1 is `High' : at read , write , row active and precharge , bank B is selected. If both BA0 is `High' and BA1 is `Low' : at read , write , row active and precharge , bank C is selected. If both BA0 and BA1 are 'High' : at read , write , row active and precharge , bank D is selected If A10/AP is `High' : at row precharge , BA0 and BA1 ignored and all banks are selected. 5. During burst read or write with auto precharge , new read/write command cannotbeissued. Another bank read/write command can be issued after the end of burst. New row active of the associated bank can be issued at tRP after the end of burst. 6. Burst stop command is valid at every burst length. 7. DQM sampled at positive going edge of a CLK masks the data-in at the very CLK (Write DQM latency is 0), but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2) TM Technology Inc. reserves the right P.12 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
TE CH
tCH
Preliminary T4312816A
Single Bit READ-Write Cycle (Same Page) @CAS Latency=3,Burst Length=1
0 CLOCK
tCL
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
tCC
CKE
HIGH
tRAS tRC
*Note1
tSH
CS
tRCD tSH tSS tRP
RAS
tSS tSH tCCD
CAS
tSS tSH tSS
ADDR
Ra
tSS
*Note2
Ca
Cb
tSH
Cc
Rb
*Note2. 3
*Note2. 3
*Note2. 3
*Note4
*Note2
BA
Bs
Bs
Bs
Bs
Bs
Bs
A10/AP
Ra
*Note3
*Note3
*Note3
*Note4
Rb
tRAC tSRC tSH
DQ
tSLZ
Qa
tOH
Db
tSS tSH
Qc
WE
tSS tSH
DQM
tSS
Row Active
Read
W rite
Read Precharge
Row Active
:Don't care
TM Technology Inc. reserves the right P.13 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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TE CH
Preliminary T4312816A
*note : 1. All input expect CKE & DQM can be don't care when CS is high at the CLK high going edge. 2. Bank active & read/write are controlled by BA0 - BA1.
BA0 0 1 0 1
BA1 0 0 1 1
Active & Read/Write Bank A Bnak B Bank C Bnak D
3. Enable and disable auto precharge function are controlled by A10/AP in read/wirte command.
A10 0 1
Auto-Precharge Disable (End of burst) Enable (End of burst)
BA0 BA1 0 1 0 1 0 0 1 1
Operation Enable read/write command for bank A . Enable read/write command for bank B . Enable read/write command for bank C . Enable read/write command for bank D .
4. A10/AP and BA control bank precharge when precharge command is asserted.
A10/AP BA0 BA1 0 0 0 0 1 0 1 0 1 X 0 0 1 1 X
precharge Bank A Bank B Bank C Bank D All Bamks
TMemory Technology Inc. reserves the right to change products or specifications without notice.
P.14
Publication Date: APR. 2003 Revision: 0.B
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0 CLOCK CKE
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Power Up Sequence
H ig h le v e l is n e c e ss a ry
CS tR P RAS
SS
tR C
SS SS tC C D SS SS
tR C
SS SS
CAS
SS SS
ADDR
SS SS
SS SS
K ey
RAa
BA
SS SS
SS SS
K ey
A 1 0 /A P
SS SS
SS SS
K ey
RAa
DQ H ig h - Z WE
SS SS SS SS
DQM
H ig h le v e l is n e c e ss a ry
P rech arg e A ll B a n k s
A u to R e f re sh
A u to R e fr e s h
M o d e R e g iste r S e t
(A -B a n k ) R ow A c tiv e
:D o n 't c a re
TM Technology Inc. reserves the right P.15 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
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0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Read & Write Cycle at Same Bank @Burst Length = 4
H IG H
* N o te1
tR C
tR C D
RAS
* N o te2
CAS
ADDR
Ra
C a0
Rb
Cb0
BA
A 1 0 /A P
Ra
tO H
Rb
CL=2
RAC * N o te3
Q a0
t tS A C
Q a1
tO H
Q a2
Q a3
* N o te4
D b0
D b1
D b2
D b3
tR D L
DQ CL=3
* N o te3
tS H Z
Q a0
tS A C
Q a1
Q a2
Q a3
* N o te4
D b0
D b1
D b2
D b3
tR D L
tS H Z
WE
DQM
R ow A c tiv e (A B ank )
R ead (A B ank )
P rech arg e (A B ank )
R o w A c tiv e (A -B n ak )
W rite (A B nak )
P rech arg e (a-B n ak )
: D o n 't c a r e
*Note : 1. Minimum row cycle times is requiqed to complete internal DRAM operation. 2. Row precharge can interrupt burst on any cycle. [CAS Latency-1] number of valid output data is available after Row precharge. Last valid output will be Hi-Z(tSHZ) after the clock. 3. Access time from Row active command. Burst can't end in Full Page Mode. TM Technology Inc. reserves the right P.16 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tCC*(tRCD+CAS latency-1)+tSAC
4. Output will be Hi-Z after the end of burst.(1,2,4,8 bit burst)
tm
0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Page Read & Write Cycle at Same Bank @ Burst Length = 4
H IG H
tR C D
RAS
* N o te2
tC C D
CAS
ADDR
Ra
C a0
Cb0
C c0
Cd0
BA
A 1 0 /A P
tR D L
CL=2 DQ CL=3
Q a0
Q a1
Q b0
Q b1
Q b2
D c0
D c1
D d0
D d1
tCD L
Q a0
Q a1
Q b0
Q b1
D c0
D c1
D d0
D d2
WE
* N o te3
* N o te1
DQM
R o w A c tiv e (A -B n ak )
R ead (A B nak )
R ead (A B nak )
W rite (A B nak )
W rite (A B nak )
P rech arg e (A -B n ak )
: D o n 't c a r e
*Note : 1. To write data before burst read ends, DQM should be asserted three cycle prior to write command to avoid bus contention. 2. Row precharge will interrupt writing. Last data input,
tRDL before Row precharge, will be written.
3. DQM should mask invalid input data on precharge command cycle when asserting precharge before end of burst. Input data after Row precharge cycle will be masked internally.
TM Technology Inc. reserves the right P.17 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE
* N o te1
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Page Read Cycle at Different Bank @ Burst Length = 4
H IG H
CS
RAS
* N o te2
CAS
ADDR
RAa
CAa
RBb
CBb
CAc
CBd
CAe
BA
A 1 0 /A P
RAa
RBb
CL=2 DQ CL=3
Q A a0
Q A a1
Q A a2
Q A a3
Q B b0
Q B b1
Q B b2
Q B b3
Q A c0
Q A c1
Q B d0
Q B d1
Q A e0
Q A e1
Q A a0
Q A a1
Q A a2
Q A a3
Q B b0
Q B b1
Q B b2
Q B b3
Q A c0
Q A c1
Q B d0
Q B d1
Q A e0
Q A e1
WE
DQM
R o w A c tiv e (A -B a n k )
R ead (A B ank ) R o w A c tiv e (B -B an k )
R ead (B B ank )
R ead (A B ank )
R ead (B B ank )
R ead (A B ank )
P rech arg e (A -B a n k )
: D o n 't c a r e
*Note : 1. CS can be don't cared when RAS , CAS and WE are high at the clock high going edge. 2. To interrupt a burst resd by row precharge, both the read and the precharge banks must be the same.
TM Technology Inc. reserves the right P.18 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Page Write cycle at Different Bank @ Burst Length = 4
H IG H
CS
RAS
CAS
* N o te 2
ADDR
RAa
CAa
RBb
CBb
CAc
CBd
BA
A 1 0 /A P
RAa
RBb
DQ
D A a0
D A a1
D A a2
D A a3
D B b0
D B b1
D B b2
D B b3
D A c0
D A c1
D B d0
D B d1
tC D L
tR D L
WE
* N o te 1
DQM
R o w A c ti v e (A -B a n k )
R o w A c ti v e (B -B a n k ) W r it e ( A B an k )
W r it e ( B B an k )
W r it e ( A B an k )
W r it e ( B B an k )
P re c h a rg e (A -B a n k )
:D o n 't c a r e
*Note : 1. To interrupt burst write by row precharge, DQM should be asserted to mask invalid input data. 2. To interrupt burst write by row precharge, both the write and the precharge banks must be the same. TM Technology Inc. reserves the right P.19 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Read & Write Cycle at Different Bank @ Burst Length = 4
H IG H
RAS
CAS
ADDR
RAa
CAa
RBb
CBb
RAc
CAc
BA
A 1 0 /A P
RAa
RBb
RAc
* N o te1
tCD L
CL=2 DQ CL=3
Q A a0
Q A a1
Q A a2
Q A a3
D B b0
D B b1
D B b2
D B b3
Q A c0
Q A c1
Q A c2
Q A a0
Q A a1
Q A a2
Q A a3
D B b0
D B b1
D B b2
D B b3
Q A c0
Q A c1
WE
DQM
R o w A c tiv e (A -B a n k )
R ead (A B ank )
R o w A c tiv e (B -B an k )
P rech arg e (A -B a n k )
W rite (B B ank ) R o w A c tiv e (A -B a n k )
R ead (A B ank )
: D o n 't c a r e
*Note : 1.
tCDL should be met to complete write.
TM Technology Inc. reserves the right P.20 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Read & Write Cycle with Auto Precharge @ Burst Length = 4
H IG H
RAS
CAS
ADDR
Ra
Rb
Ca
Cb
BA
A 1 0 /A P
Ra
Rb
CL=2 DQ CL=3
Q a0
Q a1
Q a2
Q a3
D b0
D b1
D b2
D b3
Q a0
Q a1
Q a2
Q a3
D b0
D b1
D b2
D b3
WE
DQM
R o w A c tiv e (A -B a n k )
R o w A c tiv e (B -B an k ) R e a d w ith A u to p re c h a rg e (A B ank )
C L = 2 A u to P re c h a rg e S ta rt P o in t (A -B a n k ) C L = 3 A u to P re c h a rg e S ta rt P o in t (A -B a n k )
W rite w ith A u to P rech arg e (B B ank )
A u to P re c h a rg e S ta rt P o in t (A B ank )
: D o n 't c a r e
*Note : 1.
tCDL should be controlled to meet minimum tRAS before internal precharge start.
(In the case of Burst Length = 1 & 2 and BRSW mode)
TM Technology Inc. reserves the right P.21 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Clock suspension & DQM Operation Cycle @ CAS Latency = 2 ,Burst Length = 4
CS
RAS
CAS
ADDR
Ra
Ca
Cb
Cc
BA
A 1 0 /A P
Ra
DQ
Q a0
Q a1
Q a2
Q a3
tS H Z
Q b0
Q b1
tS H Z
D c0
D c2
WE
* N o te 3
DQM
R o w A c ti v e
R ead
C lo c k S u s p e n s io n
R ead R ead Q D M
W r it e W r it e Q D M C lo c k S u s p e n s io n
W r it e Q D M
: D o n 't c a r e
*Note 1. DQM is needed to prevent bus contention.
TM Technology Inc. reserves the right P.22 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Read Interrupted by Precharge Command & Read Burst Stop Cycle @ Burst Length=Full Page
H IG H
RAS
CAS
ADDR
RAa
CAa
CAb
BA
A 1 0 /A P
RAa
* N o te2
1
1
CL=2 DQ
Q A a0
Q A a1
Q A a2
Q A a3
Q A a4
Q A b0
Q A b1
Q A b2
Q A b3
Q A b4
Q A b5
2
2
CL=3
Q A a0
Q A a1
Q A a2
Q A a3
Q A a4
Q A b0
Q A b1
Q A b2
Q A b3
Q A b4
Q A b5
WE
DQM
R o w A c tiv e (A -B a n k )
R ead (A B ank )
B u rst S to p
R ead (A B ank )
P rech arg e (A -B a n k )
: D o n 't c a r e
*Note : 1. Burst can't end in full page mode, so auto precharge can't issue. 2. About the valid DQs after burst stop, it is same as the case of RAS interrupt. Both cases are illustrated above timing diagram. See the lable 1,2 on them. But at burst write, burst stop and RAS interrupt should be compared carefully. Refer the timing diagram of `Full Page write burst stop cycle'. 3. Burst stop is valid at every burst length. TM Technology Inc. reserves the right P.23 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Write Interrupted by Prechareg Command & Write Burst Stop Cycle @ Burst Length=Full Page
H IG H
CS
RAS
CAS
ADDR
RAa
CAa
CAb
BA
A 1 0 /A P
RAa tB D L
tR D L
* N o te 3
DQ
D A a0
D A a1
D A a2
D A a3
D A a4
D A b0
D A b1
D A b2
D A b3
D A b4
D A b5
WE
DQM
R o w A c ti v e (A -B a n k )
W r it e ( A B an k )
B u r s t S to p
W r it e ( A B an k )
P re c h a rg e (A -B a n k )
: D o n 't c a r e
*Note : 1. Burst can't end in full page mode, so auto precharge can't issue. 2. Data-in at the cycle of interrupted by precharge can not be written into the corresponding memory cell. It is defined by AC parameter of tRDL. DQM at write interrupted by precharge command is needed to prevent invalid write. Input data after Row precharge cycle will be masked internally. 3. Burst stop is valid at every burst length. TM Technology Inc. reserves the right P.24 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE CS
TE CH
1 2 3 4 5 6 7 8 9 10 11 12
Preliminary T4312816A
13 14 15 16 17 18 19
Burst Read Single bit Write Cycle @ Burst Length = 2
H IG H
RAS
* N o te2
CAS
ADDR
RAa
CAa
RBb
CAb
RAc
CBc
CAd
BA
A 1 0 /A P
RAa
RBb
RAc
CL=2 DQ CL=3
D A a0
D A b0
D A b1
D B c0
D A d0
D A d1
D A a0
D A b0
D A b1
D B c0
D A d0
D A d1
WE
DQM
R o w A c tiv e (A -B a n k )
R o w A c tiv e (A -B a n k ) W rite (A B ank ) R e a d w ith A u to P rech arg e (A B ank )
R o w A c tiv e (A -B a n k )
W rite w ith A u to P rech arg e (A B ank )
R ead (A B ank )
P rech arg e (A -B a n k )
: D o n 't c a r e
*Note : 1. BRSW modes is enabled by setting A9 `High' at MRS (Mode Register Set). At the BRSW Mode, the burst length at write is fixed to `1' regardless of programmed burst length. 2. When BRSW write command with auto precharge is executed, keep it in mind that tRAS should not be violated. Auto precharge is executed at the next cycle of burst-end, so in the case of BRSW write command, the precharge command will be issued after two clock cycle. TM Technology Inc. reserves the right P.25 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
CLOCK CKE
TE CH
0 1 2 3
SS SS
* N o te 2
Preliminary T4312816A
4 5 6 7 8 9
SS ts s ts s
Active/ Precharge Power Down Mode @ CAS latency = 2, Butsr length = 4
10 11 12 13 14 15 16 17 18 19
ts s
* N o te 1
SS
* N o te 3
CS
SS SS
SS SS
RAS
SS SS
SS SS
CAS
SS SS
SS SS
ADDR
SS SS
Ra
SS SS
Ca
BA
SS SS
SS SS
A 1 0 /A P
SS SS
Ra
SS SS tSH Z
DQ
SS
SS
Q a0 Q a1
Q a2
WE
SS SS
SS SS
DQM
SS SS
SS SS
P re c h a r g e P o w erD o w n E n try
R o w A c tiv e A c tiv e P re c h a r g e P o w erP o w erD o w n E n try D o w n E x it
R ead A c tiv e P o w erD o w n E x it P re c h a r g e
:D o n 't c a re
*Note : 1. Both banks should be in idle state prior to entering precharge power down mode. 2. CKE should be set high at least 1CLK+tSS prior to Row active command. 3. Can not violate minimum refresh specification.(64ms) TM Technology Inc. reserves the right P.26 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE CS
TE CH
1 2 3
* N o te 2
Preliminary T4312816A
4 5 6
SS SS
* N o te 4
Self Refresh Entry & Exit Cycle
7 8 9 10 11 12 13
SS t R C m in
* N o te 1 * N o te 3 * N o te 6
14
15
16
17
18
19
SS
SS tSS SS
* N o te 5
SS
SS
RAS
SS SS
SS SS
* N o te 7
CAS
SS SS
SS SS
ADDR
SS SS
SS SS
BA
SS SS
SS SS
A 1 0 /A P
SS SS
SS SS
DQ
H i-z
SS
H i-z
SS
WE
SS SS
SS SS
DQM
SS SS
SS SS
S e lf R e fr e s h E n try
S e lf R e fr e s h E x it
A u to R e fre sh
: D o n 't c a r e
*Note : TO ENTER SELF REFRESH MODE 1.
CS , RAS & CAS with CKE should be low at the same clock cycle.
2. After 1 clock cycle, all the inputs inculding the system clock can be don't care except for CKE. 3. The device remains in self refresh mode as long as CKE stays `Low'. Cf.) Once the device enters self refresh mode, minimum tRAS is required before exit from self refresh. TO EXIT SELF REFRESH MODE 4. System clock restart and be stable before returning CKE high. 5.
CS starts from high.
6. Minimum tRC is required after CKE going high to complete self refresh exit. 7. 2K cycle of burst auto refresh is required before self refresh entry and after self refresh exit if the system uses burst refresh.
TM Technology Inc. reserves the right P.27 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B
tm
0 CLOCK CKE
TE CH
1 2 3 4 5 6 0 1 2 3
Preliminary T4312816A
Auto Refresh Cycle
4 5 6
SS
Mode Register Set Cycle
7
8
9
10
H IG H
H IG H
SS
CS
* N o te 2
SS
tR P C SS SS
RAS
* N o te 1
CAS
SS SS
* N o te 3
ADDR
K ey
K ey
SS SS
DQ
H i-z
H i-z
SS
WE
SS SS
DQM
SS SS
M RS
N ew C om m and
A u to R e fre sh
N ew C om m and
:D o n 't c a re
*Both banks precharge should be completed before Mode Register Set cycle and auto refresh cycle. MODE REGISTER SET CYCLE *Note : 1. CS , RAS , CAS & WE activation at the same clock cycle with address key will set internal mode register. 2. Minimum 2 clock cycles should be met before new RAS activation. 3. Please refer to Mode Register Set table. TM Technology Inc. reserves the right P.28 to change products or specifications without notice. Publication Date: APR. 2003 Revision: 0.B
tm
54
TE CH
Preliminary T4312816A
PACKAGE DIMENSIONS 54 LEAD TSOP-II (400 mil)
D 28 A A2
E1
E
A1 1 27
C B1 B
Symbol A A1 A2 B B1 C D E E1
Dimension in mm Min Nom Max 1.2 0.4 0.5 0.6 0.15 0.24 0.32 0.40 0.8 0.05 0.10 0.15 22.12 22.22 22.62 11.56 11.76 11.96 10.06 10.16 10.26 0 8
Dimension in inch Min Nom Max 0.047 0.016 0.020 0.024 0.006 0.009 0.012 0.016 0.0315 0.002 0.004 0.006 0.871 0.875 0.905 0.455 0.463 0.471 0.396 0.400 0.404 0 8
TM Technology Inc. reserves the right P.29 to change products or specifications without notice.
Publication Date: APR. 2003 Revision: 0.B


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